Resources

Engineering a Stable Battery Housing Challenge During early module testing, a battery manufacturer observed localized housing deformation and edge-seal failures after repeated charge/discharge cycles. Post test inspections revealed subtle swelling and misalignment in the cell stack—but the root...

Pressure Mapping for EV Design Design differences and challenges for the next generation of EVs can be quite different than existing design for internal combustion vehicles. In addition to the core battery stack assembly and design, pressure mapping system analysis is key to many different aspects...

Battery formation is a pivotal stage in the manufacture of batteries, determining their performance and longevity. This process involves the initial electrochemical transformation of raw materials, shaping the battery's efficiency and stability. Through controlled charge and discharge cycles, the...

Wafer Polishing Pressure Measurement Wafer or Chemical Mechanical Polishing (CMP) requires that an even surface is achieved or subsequent manufacturing steps will be adversely affected, costing your company money. The I-Scan™ pressure mapping system provides instantaneous insight into the pressures...

Semiconductor Clamping Pressure Distribution Challenge Unknown clamping forces during computer chip and heat sink mounting or wafer probe testing can cause considerable product defects and quality issues. This can lead to lower yields and increased costs and product waste. Solution The I-Scan™ force...

Evaluate Brush-to-Wafer Contact Pressure Polyvinyl alcohol (PVA) brushes are used in the semiconductor process during the post-CMP cleaning stage. Different PVA brush designs can affect wafer cleaning efficiency. Ensuring proper brush-to-wafer contact pressure and contact area is crucial in...