eBook

Insight from Pressure Mapping into Semiconductor Quality and Manufacturing

Measure Interface Pressure to Increase Reliability & Yields

Tekscan's Pressure Mapping technology can measure interface pressure to increase reliability & yields. Free eBook outlines insights gained from pressure mapping in various applications related to the semiconductor industry.

Download this free eBook to learn how Pressure Mapping technology can validate design and manufacturing in the Semiconductor Industry. The eBook presents examples of how pressure mapping can give you actionable interface pressure data to increase reliability & yields in semicondcutor manufacturing and design.

Insight from Pressure Mapping into Semiconductor Quality and Manufacturing

Topics:

  • Unique insights into Semiconductor applications from pressure mapping data
  • Analysis of how pressure mapping data  influences real-world manufacturing applications for:
    • Heat Sink
    • CMP Wafer Polishing
    • Wafer Bonding
    • Post-CMP PVA Brush Testing
    • Precision Clamping

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